Feature
High-performance, EEPROM-based programmable logic devices (PLDs) based on second-generation MAX® architecture
■ 5.0-V in-system programmability (ISP) through the built-in IEEE Std. 1149.1 Joint Test Action Group (JTAG) interface available in MAX 7000S devices
– ISP circuitry compatible with IEEE Std. 1532
■ Includes 5.0-V MAX 7000 devices and 5.0-V ISP-based MAX 7000S devices
■ Built-in JTAG boundary-scan test (BST) circuitry in MAX7000S devices with 128 or more macrocells
■ 5.0-V in-system programmability (ISP) through the built-in IEEE Std. 1149.1 Joint Test Action Group (JTAG) interface available in MAX 7000S devices
– ISP circuitry compatible with IEEE Std. 1532
■ Includes 5.0-V MAX 7000 devices and 5.0-V ISP-based MAX 7000S devices
■ Built-in JTAG boundary-scan test (BST) circuitry in MAX7000S devices with 128 or more macrocells
