Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
DescriptionThe SN74AC11IPWREP device contains three independent 3-input AND gates. This device performs the Boolean function Y = A ? B ? C or Y = (A\ + B\ + C\)\ in positive logic.
Feature
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree
- 2-V to 6-V VCC Operation
- Inputs Accept Voltages to 6 V
- Max tpd of 7.5 ns at 5 V
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
DescriptionThe SN74AC11 device contains three independent 3-input AND gates. This device performs the Boolean function Y = A ? B ? C or Y = (A\ + B\ + C\)\ in positive logic.
