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SN74LV11ATPWREP

  • 描述:逻辑类型: AND门 电线数量: three 输入数量: three 电源电压: 2伏~5.5伏 供应商设备包装: 14-TSSOP 安装类别: 表面安装
  • 品牌: 德州仪器 (Texas)
  • 交期:5-7 工作日
渠道:
  • 自营
  • 得捷
  • 贸泽

起订量: 226

数量 单价 合计
2000+ 11.40756 22815.13600
  • 库存: 10000
  • 单价: ¥9.63306
  • 数量:
    - +
  • 总计: ¥2,177.07
在线询价

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规格参数

  • 制造厂商 德州仪器 (Texas)
  • 部件状态 可供货
  • 特点 -
  • 电源电压 2伏~5.5伏
  • 最大静态电流 20A.
  • 输出高电流, 输出低电流 12毫安, 12毫安
  • 低逻辑电平 0.5伏
  • 高逻辑电平 1.5伏
  • 安装类别 表面安装
  • 电线数量 three
  • 输入数量 three
  • 逻辑类型 AND门
  • 供应商设备包装 14-TSSOP
  • 包装/外壳 14-TSSOP(0.173“,4.40毫米宽)
  • 最大传播延迟 @ 电压(V), 最大负载电容(CL) 7.9ns @ 5V, 50皮法
  • 工作温度 -40摄氏度~105摄氏度

SN74LV11ATPWREP 产品详情

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

This triple 3-input positive-AND gate is designed for 2-V to 5.5-V VCC operation.

The SN74LV11ATPWREP performs the Boolean function Y = A ? B ? C or Y = (A\ + B\ + C\)\ in positive logic.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

Feature

  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 105°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 5.5-V VCC Operation
  • Typical VOLP (Output Ground Bounce) <0.8 V at VCC= 3.3 V, TA = 25°C
  • Typical VOHV (Output VOH Undershoot) >2.3 V at VCC = 3.3 V, TA = 25°C
  • Supports Mixed-Mode Voltage Operation on All Ports
  • Ioff Supports Partial-Power-Down Mode Operation

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

This triple 3-input positive-AND gate is designed for 2-V to 5.5-V VCC operation.

The SN74LV11A performs the Boolean function Y = A ? B ? C or Y = (A\ + B\ + C\)\ in positive logic.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

SN74LV11ATPWREP所属分类:逻辑门/反相器,SN74LV11ATPWREP 由 德州仪器 (Texas) 设计生产,可通过久芯网进行购买。SN74LV11ATPWREP价格参考¥9.633057,你可以下载 SN74LV11ATPWREP中文资料、PDF数据手册、Datasheet数据手册功能说明书,可查询SN74LV11ATPWREP规格参数、现货库存、封装信息等信息!

德州仪器 (Texas)

德州仪器 (Texas)

德州仪器公司(TI)是一家开发模拟IC和嵌入式处理器的全球半导体设计和制造公司。通过雇用世界上最聪明的人,TI创造了塑造技术未来的创新。如今,TI正在帮助超过10万名客户改变未来。

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