The LTM4680IY is a dual 30A or single 60A step-down µModule® (power module) DC/DC regulator featuring remote configurability and telemetry-monitoring of power management parameters over PMBus—an open standard I2C-based digital interface protocol. The LTM4680IY is comprised of digitally programmable analog control loops, precision mixed-signal circuitry, EEPROM, power MOSFETs, inductors and supporting components.
The LTM4680’s 2-wire serial interface allows outputs to be margined, tuned and ramped up and down at programmable slew rates with sequencing delay times. True input current sense, output currents and voltages, output power, temperatures, uptime and peak values are readable. Custom configuration of the EEPROM contents is not required. At start-up, output voltages, switching frequency, and channel phase angle assignments can be set by pin-strapping resistors. The LTpowerPlay® GUI and DC1613 USB-to-PMBus converter and demo kits are available.
The LTM4680IY is offered in a 16mm × 16mm × 7.82mm BGA package available with SnPb or RoHS compliant terminal finish. Pin compatible with LTM4678.
Feature
- Dual 30A or Single 60A Digitally Adjustable Analog Loops with Digital Interface for Control and Monitoring
- Wide Input Voltage Range: 4.5V to 16V
- Output Voltage Range: 0.5V to 3.3V
- 90% Full Load Efficiency from 12VIN to 1VOUT at 60A
- ±0.5% Maximum DC Output Error Over Temperature
- ±2.5% Current Readback Accuracy (25°C to 125°C)
- Integrated Input Current Sense Amplifier
- 400kHz PMBus-Compliant I2C Serial Interface
- Supports Telemetry Polling Rates up to 125Hz
- Constant Frequency Current Mode Control
- Parallel and Current Share Multiple Modules
- Pin Compatible with LTM4678
- 16mm × 16mm × 7.82mm BGA Package
- Input and Output Voltages, Currents, and Temperatures
- Running Peak Values, Uptime, Faults and Warnings
- Onboard EEPROM Fault Log Record
- Output Voltage, Voltage Sequencing and Margining
- Digital Soft-Start/Stop Ramp, Program Analog Loop
- OV/UV/OT, UVLO, Frequency and Phasing
Applications
- System Optimization, Characterization and Data Mining in Prototype, Production and Field Environments
