The NXP Semiconductors SA56004FDP,118 is an SMBus compatible, 11-bit remote/local digitaltemperature sensor with over-temperature alarms. The remote channel of the SA56004Xmonitors a diode junction, such as a substrate PNP of a microprocessor or a diodeconnected transistor such as the 2N3904 (NPN) or 2N3906 (PNP). With factory trimming,remote sensor accuracy of ±1 °C is achieved.
Under-temperature and over-temperature alert thresholds can be programmed to cause theALERT output to indicate when the on-chip or remote temperature is out of range. Thisoutput may be used as a system interrupt or SMBus alert. The T_CRIT output is activatedwhen the on-chip or remote temperature measurement rises above the programmedT_CRIT threshold register value. This output may be used to activate a cooling fan, senda warning or trigger a system shutdown. To further enhance system reliability, theSA56004FDP,118 employs an SMBus time-out protocol. The SA56004FDP,118 has a advanced devicearchitecture.
The SA56004FDP,118 is available in the SO8, TSSOP8 and HVSON8 packages. SA56004FDP,118 has8 factory-programmed device address options. The SA56004FDP,118 is pin-compatible with theLM86, MAX6657/8, and ADM1032.
Feature
- Accurately senses temperature of remote microprocessor thermal diodes or diodeconnected transistors within ±1 °C
- On-chip local temperature sensing within ±2 °C
- Temperature range of −40 °C to +125 °C
- 11-bit, 0.125 °C resolution
- 8 different device addresses are available for server applications. The SA56004EDwith marking code 56004E, and SA56004EDP with marking code 6004E are addresscompatible with the National LM86, the MAX6657/8 and the ADM1032
- Offset registers available for adjusting the remote temperature accuracy
- Programmable under/overtemperature alarms: ALERT and T_CRIT
- SMBus 2.0 compatible interface, supports TIMEOUT
- Operating voltage range: 3.0 V to 3.6 V
- I²C-bus Standard-mode and Fast-mode compatible
- SO8, TSSOP8 and HVSON8 packages
- Programmable conversion rate (0.0625 Hz to 26 Hz)
- Undervoltage lockout prevents erroneous temperature readings
- Latch-up testing is done to JEDEC Standard JESD78 which exceeds 100 mA
- System thermal management in laptops, desktops, servers and workstations
- Computers and office electronic equipment
- Electronic test equipment and instrumentation
- HVAC
- Industrial controllers and embedded systems
