■ 2.16 V to 3.6 V single supply operation
■ 1.8 V compatible IOs
■ I2C/SPI digital output interfaces
■ Programmable 12 or 16 bit data representation
■ Interrupt activated by motion
■ Programmable interrupt threshold
■ Embedded self test
■ High shock survivability
■ ECOPACK® compliant
Description
The LIS3LV02DL is a three axes digital output linear accelerometer that includes a sensing element and an IC interface able to take the information from the sensing element and to provide the measured acceleration signals to the external world through an I2C/SPI serial interface.
The sensing element, capable of detecting the acceleration, is manufactured using a dedicated process developed by ST to produce inertial sensors and actuators in silicon.
The IC interface instead is manufactured using a CMOS process that allows high level of integration to design a dedicated circuit which is factory trimmed to better match the sensing element characteristics.
The LIS3LV02DL has a user selectable full scale of ±2g, ±6g and it is capable of measuring acceleration over a bandwidth of 640 Hz for all axes. The device bandwidth may be selected accordingly to the application requirements.
The self-test capability allows the user to check the functioning of the device.
The device may be also configured to generate an inertial wake-up/free-fall interrupt signal when a programmable acceleration threshold is crossed at least in one of the three axes.
The LIS3LV02DL is available in plastic SMD package and it is specified over a temperature range extending from -40°C to+85°C.
The LIS3LV02DL belongs to a family of products suitable for a variety of applications:
– Free-Fall detection
– Motion activated functions in portable terminals
– Antitheft systems and Inertial navigation
– Gaming and virtual reality input devices
– Vibration monitoring and compensation
Feature
- 2.16 to 3.6V Single supply operation
- 1.8V Compatible IOs
- Programmable 12 or 16-bit data representation
- Interrupt activated by motion
- Programmable interrupt threshold
- Embedded self test
- High shock survivability
(Picture: Pinout)