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CLVC1G125MDCKREP

  • 描述:逻辑类型: 缓冲区,非反相 电源电压: 1.65伏~5.5伏 每个元件的位数: one 供应商设备包装: SC-70-5 工作温度: -55摄氏度~125摄氏度(TA) 安装类别: 表面安装
  • 品牌: 德州仪器 (Texas)
  • 交期:5-7 工作日
渠道:
  • 自营
  • 得捷
  • 贸泽

起订量: 1

  • 库存: 6624
  • 单价: ¥14.05123
  • 数量:
    - +
  • 总计: ¥14.05
在线询价

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规格参数

  • 制造厂商 德州仪器 (Texas)
  • 部件状态 可供货
  • 逻辑类型 缓冲区,非反相
  • 元件数量 one
  • 输入类别 -
  • 输出类别 三态
  • 安装类别 表面安装
  • 工作温度 -55摄氏度~125摄氏度(TA)
  • 每个元件的位数 one
  • 电源电压 1.65伏~5.5伏
  • 输出高电流, 输出低电流 32毫安, 32毫安
  • 包装/外壳 5-TSSOP, SC-70-5, SOT-353
  • 供应商设备包装 SC-70-5

CLVC1G125MDCKREP 产品详情

This bus buffer gate is designed for 1.65-V to 5.5-V VCC operation.

The SN74LVC1G125 is a single line driver with a 3-state output. The output is disabled when the output-enable (OE should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

Feature

  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Supports 5-V VCC Operation
  • Inputs Accept Voltages to 5.5 V
  • Max tpd of 3.7 ns at 3.3 V
  • Low Power Consumption, 10-μA Max ICC
  • ±24-mA Output Drive at 3.3 V
  • Ioff Supports Partial-Power-Down Mode Operation
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

CLVC1G125MDCKREP所属分类:逻辑接收/发送/驱动/缓冲器,CLVC1G125MDCKREP 由 德州仪器 (Texas) 设计生产,可通过久芯网进行购买。CLVC1G125MDCKREP价格参考¥14.051226,你可以下载 CLVC1G125MDCKREP中文资料、PDF数据手册、Datasheet数据手册功能说明书,可查询CLVC1G125MDCKREP规格参数、现货库存、封装信息等信息!

德州仪器 (Texas)

德州仪器 (Texas)

德州仪器公司(TI)是一家开发模拟IC和嵌入式处理器的全球半导体设计和制造公司。通过雇用世界上最聪明的人,TI创造了塑造技术未来的创新。如今,TI正在帮助超过10万名客户改变未来。

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